APD imaging probe for tritium surface contamination

Richard A. Myers; Richard Farrell; Frank Robertson; David Dogruel; R. Scott Willms

doi:10.1117/12.800763

3 September 2008 APD imaging probe for tritium surface contamination

Richard A. Myers, Richard Farrell, Frank Robertson, David Dogruel, R. Scott Willms

Proceedings Volume 7080, Penetrating Radiation Systems and Applications IX; 70800C (2008) https://doi.org/10.1117/12.800763
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

We report on the development of a practical, easy-to-use, multi-element, solid-state instrument for detecting and imaging tritium contamination on surfaces. The innovation, which enables this instrumentation, relies on cutting-edge silicon avalanche photodiode (APD) array detector technology to provide an effective coverage area without compromising the overall sensitivity. We discuss the design and assembly of a prototype unit to monitor a surface area of over 900 mm² while maintaining a spatial resolution of less than 4 mm. During tests at Los Alamos National Laboratories, we demonstrated tritium counting efficiencies of over 40% and established that this unit can be used to expedite established testing procedures by locating areas of potential activity or when combined with established swipe analysis.

Citation Download Citation

Richard A. Myers, Richard Farrell, Frank Robertson, David Dogruel, and R. Scott Willms "APD imaging probe for tritium surface contamination", Proc. SPIE 7080, Penetrating Radiation Systems and Applications IX, 70800C (3 September 2008); https://doi.org/10.1117/12.800763

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KEYWORDS

Avalanche photodetectors

Sensors

PIN photodiodes

Contamination

Electronics

Human-machine interfaces

Silicon

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