Phase error correction for multiple planes using sharpness metrics

Abbie E. Tippie; James R. Fienup

doi:10.1117/12.795193

26 August 2008 Phase error correction for multiple planes using sharpness metrics

Abbie E. Tippie, James R. Fienup

Proceedings Volume 7094, Unconventional Imaging IV; 709404 (2008) https://doi.org/10.1117/12.795193
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Phase errors introduced in the object beam of a digital hologram degrade the image quality of the object. We present computer simulations showing the effect of multiple planes of phase errors in the propagation path. By using a nonlinear optimization technique to maximize sharpness metrics, we show results that account for aberrations in multiple planes and correct anisoplanatic blur. This paper demonstrates this technique for two and three phase screens.

Citation Download Citation

Abbie E. Tippie and James R. Fienup "Phase error correction for multiple planes using sharpness metrics", Proc. SPIE 7094, Unconventional Imaging IV, 709404 (26 August 2008); https://doi.org/10.1117/12.795193

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