A survey of modeling methods for analog circuit testability analysis

Xiaomei Chen; Xiaofeng Meng; Bo Zhong; Hong Ji

doi:10.1117/12.806750

13 October 2008 A survey of modeling methods for analog circuit testability analysis

Xiaomei Chen, Xiaofeng Meng, Bo Zhong, Hong Ji

Proceedings Volume 7127, Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence; 71272K (2008) https://doi.org/10.1117/12.806750
Event: Seventh International Symposium on Instrumentation and Control Technology, 2008, Beijing, China

Abstract

Analog signal circuit is the necessary component of modern electronic products. The research on the testability of analog signal circuit becomes the highlighted topic. In this paper, the modeling types are first discussed, then several different testability analysis based on different modeling methods are systematically summarized and explained, which includes numerical analysis method, symbolic analysis method, pole-zero analysis method, TTF method, CCM method, DES method, single dependency method, multi-signal method. As for every method, the basic idea, the research status, the practice and application instances, and the advantage/disadvantage are involved. At last, the future research topics are predicted.

Citation Download Citation

Xiaomei Chen, Xiaofeng Meng, Bo Zhong, and Hong Ji "A survey of modeling methods for analog circuit testability analysis", Proc. SPIE 7127, Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence, 71272K (13 October 2008); https://doi.org/10.1117/12.806750

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