Paper
20 May 2009 A mechanistic cutting force model for diamond fly-cutting of microstructured surface
Qingliang Zhao, Bing Guo, Hui Yang, Xiaohu Zhang
Author Affiliations +
Proceedings Volume 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 728204 (2009) https://doi.org/10.1117/12.830782
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China
Abstract
In diamond fly-cutting of microstructured surface, the cutting force plays a crucial role in the establishment of cutting plans, the setting of cutting conditions and the determination of the characteristics of cutting processes like tool wear and surface texture. The characteristics of cutting force are introduced and a mechanistic cutting force model for predicting the cutting force in diamond fly-cutting of microstructured surface is proposed in this study. In the model the cutting edge radius of single crystal diamond tool is considered. Furthermore the contribution of elastic deformation of the workpiese to the total force is also accounted. The force components in the horizontal 'X' and 'Y' direction are calculated from material hardness, elastic modulus, uncut chip area, tool geometry and the average value of shear angle respectively. And the predicted cutting forces are consistent with experimental cutting force.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qingliang Zhao, Bing Guo, Hui Yang, and Xiaohu Zhang "A mechanistic cutting force model for diamond fly-cutting of microstructured surface", Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 728204 (20 May 2009); https://doi.org/10.1117/12.830782
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Cited by 10 scholarly publications.
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KEYWORDS
Diamond

Crystals

Micro cutting

Diamond machining

Fourier transforms

Imaging systems

Scanning electron microscopy

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