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We observe critical coupling to surface phonon-polaritons in silicon carbide by attenuated total reflection of
mid-infrared radiation. Reflectance measurements demonstrate critical coupling by a double-scan of wavelength
and incidence angle. Critical coupling occurs when prism coupling loss is equal to losses in silicon carbide and
the substrate, resulting in maximal electric field enhancement.
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Burton Neuner III, Dmitriy Korobkin, Chris Fietz, Davy Carole, Gabriel Ferro, Gennady Shvets, "Critically coupled surface phonon-polariton excitation in silicon carbide," Proc. SPIE 7394, Plasmonics: Metallic Nanostructures and Their Optical Properties VII, 73942B (2 September 2009); https://doi.org/10.1117/12.825403