Study on corrective algorithms for reflective tomography laser radar imaging wavefront curvature

Xiaofeng Jin; Yi Yan; Jianfeng Sun; Liren Liu

doi:10.1117/12.824685

27 August 2009 Study on corrective algorithms for reflective tomography laser radar imaging wavefront curvature

Xiaofeng Jin, Yi Yan, Jianfeng Sun, Liren Liu

Proceedings Volume 7419, Infrared Systems and Photoelectronic Technology IV; 74190X (2009) https://doi.org/10.1117/12.824685
Event: SPIE Photonic Devices + Applications, 2009, San Diego, California, United States

Abstract

The filtered back-projection algorithm is referenced and used for reflective tomography laser radar imaging reconstruction because of its simplicity and computational efficiency. Due to the divergence angle of the laser beam, wave front becomes fanned surface. However, direct fan-beam filtered back-projection imaging algorithm with the fan-beam reflective projection data exits huge computational complexity and long time consuming. To solve this question, the double broken lines filtered back-projection algorithm is introduced to implement the image reconstructions. Fan-beam reflective data is filtered and back-projected to the double broken lines with corresponding angles and distances. Images reconstructed by fan-beam filtered back-projection and double broken lines filtered back-projection are compared by computer simulation based on reflective projection data. The simulation results show that double broken lines filtered back-projection algorithm is effective in solving the computational complexity problem in image reconstruction without compromising the image resolution, also with the increasing distance between the detector and the target, the images reconstructed by the double broken lines filtered back-projection are increasing closely to the reference image.

Citation Download Citation

Xiaofeng Jin, Yi Yan, Jianfeng Sun, and Liren Liu "Study on corrective algorithms for reflective tomography laser radar imaging wavefront curvature", Proc. SPIE 7419, Infrared Systems and Photoelectronic Technology IV, 74190X (27 August 2009); https://doi.org/10.1117/12.824685

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