Paper
9 September 2010 HHG beam wavefront measurement by XUV PDI sensor
P. Homer, B. Rus, J. Hrebicek, M. Kozlova, D. Snopek
Author Affiliations +
Proceedings Volume 7652, International Optical Design Conference 2010; 76521Q (2010) https://doi.org/10.1117/12.870571
Event: International Optical Design Conference 2010, 2010, Jackson Hole, WY, United States
Abstract
We performed measurement of the HHG (High-order Harmonics Generation) beam wavefront by the PDI (Point Diffraction Interferometer) sensor recently. The XUV HHG beam operates at wavelength 30nm with 1kHz pulse frequency delivering average energy 1nJ in the beam. This beamline is located in the PALS laser centre facility in Prague. The PDI sensor is a self-referencing monolithic device and it consists of a thin foil and a very small pinhole. The foil is semi-transparent for the XUV radiation and it is used as a density filter. The pinhole is located on the axis of the XUV beam focal spot and works as a diffraction aperture generating a reference spherical wave. If the XUV detector is placed behind the PDI sensor interferogram can be captured. It represents an interference between the spherical reference wave and the original measured wave which passed the thin foil. From the information encoded in this pattern it is possible to sequentially reconstruct the beam wavefront profile. In this paper we will discuss obtained results as well as design and setup of the XUV PDI sensor.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Homer, B. Rus, J. Hrebicek, M. Kozlova, and D. Snopek "HHG beam wavefront measurement by XUV PDI sensor", Proc. SPIE 7652, International Optical Design Conference 2010, 76521Q (9 September 2010); https://doi.org/10.1117/12.870571
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KEYWORDS
Sensors

Extreme ultraviolet

Wavefronts

Spherical lenses

Diffraction

Aluminum

Optical testing

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