Paper
3 May 2010 Improved MWIR reference sources for FPA non-uniformity correction
Michael J. Crosbie, Neil T. Gordon, David J. Hall, Janet E. Hails, Christopher J. Little, Stuart C. Ashley, Christopher Axcell
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Abstract
We have previously discussed the potential of using an Hg1-xCdxTe (MCT) source as a reference plane for the nonuniformity correction of thermal imagers. Due to the fast switching speed, the apparent temperature can be changed on a frame to frame basis. This allows multipoint correction data to be obtained without having to wait for temperatures to stabilize as with a Peltier reference source. Also, the operation of the device can be synchronized to the integration period of the camera to reduce the mean power requirements by the ratio of the frame to the integration time and hence thermal heating effects are also reduced. In this paper, we discuss a practical implementation of this concept in a thermal imaging camera, which is being developed as part of the UK MOD Albion program. This development has involved increasing the device size, increasing the effective temperature range and matching the drive requirements to typical camera power supplies. The factors determining the achievable effective temperatures are discussed, together with modifications to the device design that have been implemented to obtain a useful temperature range. The drive requirements have been improved by developing a series connected structure. This has reduced the peak current by a factor of 4 and allows the devices to be controlled with conventional Peltier reference electronics rather than a custom unit. The improved devices have now been incorporated into a state-of-the-art infrared camera and their performance in this system will be discussed.
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Michael J. Crosbie, Neil T. Gordon, David J. Hall, Janet E. Hails, Christopher J. Little, Stuart C. Ashley, and Christopher Axcell "Improved MWIR reference sources for FPA non-uniformity correction", Proc. SPIE 7660, Infrared Technology and Applications XXXVI, 76603U (3 May 2010); https://doi.org/10.1117/12.853337
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KEYWORDS
Cameras

Temperature metrology

Nonuniformity corrections

Diodes

Infrared radiation

Imaging systems

Staring arrays

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