Spectral measurement using IC-compatible linear variable optical filter

Arvin Emadi; Semen Grabarnik; Huaiwen Wu; Ger de Graaf; Karin Hedsten; Peter Enoksson; Jose Higino Correia; Reinoud F. Wolffenbuttel

doi:10.1117/12.854548

14 May 2010 Spectral measurement using IC-compatible linear variable optical filter

Arvin Emadi, Semen Grabarnik, Huaiwen Wu, Ger de Graaf, Karin Hedsten, Peter Enoksson, Jose Higino Correia, Reinoud F. Wolffenbuttel

Author Affiliations +

Proceedings Volume 7716, Micro-Optics 2010; 77162G (2010) https://doi.org/10.1117/12.854548
Event: SPIE Photonics Europe, 2010, Brussels, Belgium

Abstract

This paper reports on the functional and spectral characterization of a microspectrometer based on a CMOS detector array covered by an IC-Compatible Linear Variable Optical Filter (LVOF). The Fabry-Perot LVOF is composed of 15 dielectric layers with a tapered middle cavity layer, which has been fabricated in an IC-Compatible process using resist reflow. A pattern of trenches is made in a resist layer by lithography and followed by a reflow step result in a smooth tapered resist layer. The lithography mask with the required pattern is designed by a simple geometrical model and FEM simulation of reflow process. The topography of the tapered resist layer is transferred into silicon dioxide layer by an optimized RIE process. The IC-compatible fabrication technique of such a LVOF, makes fabrication directly on a CMOS or CCD detector possible and would allow for high volume production of chip-size micro-spectrometers. The LVOF is designed to cover the 580 nm to 720 spectral range. The dimensions of the fabricated LVOF are 5×5 mm². The LVOF is placed in front of detector chip of a commercial camera to enable characterization. An initial calibration is performed by projecting monochromatic light in the wavelength range of 580 nm to 720 nm on the LVOF and the camera. The wavelength of the monochromatic light is swept in 1 nm steps. The Illuminated stripe region on the camera detector moves as the wavelength is swept. Afterwards, a Neon lamp is used to validate the possibility of spectral measurement. The light from a Neon lamp is collimated and projected on the LVOF on the camera chip. After data acquisition a special algorithm is used to extract the spectrum of the Neon lamp.

Citation Download Citation

Arvin Emadi, Semen Grabarnik, Huaiwen Wu, Ger de Graaf, Karin Hedsten, Peter Enoksson, Jose Higino Correia, and Reinoud F. Wolffenbuttel "Spectral measurement using IC-compatible linear variable optical filter", Proc. SPIE 7716, Micro-Optics 2010, 77162G (14 May 2010); https://doi.org/10.1117/12.854548

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available