Paper
21 February 2011 Optimized biasing of pump laser diodes in a highly reliable metrology source for long-duration space missions
Ilya Y. Poberezhskiy, Daniel H. Chang, Hernan Erlig
Author Affiliations +
Abstract
Optical metrology system reliability during a prolonged space mission is often limited by the reliability of pump laser diodes. We developed a metrology laser pump module architecture that meets NASA SIM Lite instrument optical power and reliability requirements by combining the outputs of multiple single-mode pump diodes in a low-loss, high port count fiber coupler. We describe Monte-Carlo simulations used to calculate the reliability of the laser pump module and introduce a combined laser farm aging parameter that serves as a load-sharing optimization metric. Employing these tools, we select pump module architecture, operating conditions, biasing approach and perform parameter sensitivity studies to investigate the robustness of the obtained solution.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ilya Y. Poberezhskiy, Daniel H. Chang, and Hernan Erlig "Optimized biasing of pump laser diodes in a highly reliable metrology source for long-duration space missions", Proc. SPIE 7918, High-Power Diode Laser Technology and Applications IX, 791807 (21 February 2011); https://doi.org/10.1117/12.877605
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KEYWORDS
Diodes

Semiconductor lasers

Reliability

Metrology

Laser metrology

Laser development

Lasers

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