Time-resolved x-ray scattering

Daniel Schick; Clemens von Korff Schmising; André Bojahr; Mareike Kiel; Peter Gaal; Matias Bargheer

doi:10.1117/12.877147

21 February 2011 Time-resolved x-ray scattering

Daniel Schick, Clemens von Korff Schmising, André Bojahr, Mareike Kiel, Peter Gaal, Matias Bargheer

Proceedings Volume 7937, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV; 793715 (2011) https://doi.org/10.1117/12.877147
Event: SPIE OPTO, 2011, San Francisco, California, United States

Abstract

Ultrafast x-ray diffraction (UXRD) has become more and more prevalent in various scientific disciplines that are interested in directly observing atomic motion in real time. The timescale, amplitude and phase of collective atomic motion can be determined with high accuracy, even when the induced amplitude is smaller than thermal fluctuations. The structural rearrangements induced by an ultrafast stimulus (charge carriers excitation or heat deposition by a laser pulse) can be recorded in real time. Here we report on a new laser-driven plasma-x-ray source (PXS) and discuss different applications which will be addressed in UXRD experiments.

Citation Download Citation

Daniel Schick, Clemens von Korff Schmising, André Bojahr, Mareike Kiel, Peter Gaal, and Matias Bargheer "Time-resolved x-ray scattering", Proc. SPIE 7937, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV, 793715 (21 February 2011); https://doi.org/10.1117/12.877147

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