Paper
22 September 2011 Diffuse cone behavior and microscopic structure of the de Vries smectic-A and smectic-C phases
HyunGuen Yoon, Dena M. Agra-Kooijman, Khurshid Ayub, Robert P. Lemieux, Satyendra Kumar
Author Affiliations +
Abstract
Direct synchrotron x-ray scattering measurements of the orientational order parameter, S, corresponding to the siloxane and hydrocarbon parts of the molecule, smectic layer spacing, and director tilt angle with respect to the smectic-C (SmC) layer normal in the de Vries smectics-A (SmA) and SmC phases of two organosiloxane mesogens are reported. The results reveal that (i) the SmC (tilt) order parameter exponent β = 0.26 ± 0.01 for 2nd order SmA-SmC transition in excellent agreement with the tricritical behavior, (ii) the siloxane and hydrocarbon parts of the molecules are segregated and oriented parallel to the director with different degree of orientational order, and (iii) thermal evolution of the effective molecular length is different in the two phases contrary to the conventional wisdom.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
HyunGuen Yoon, Dena M. Agra-Kooijman, Khurshid Ayub, Robert P. Lemieux, and Satyendra Kumar "Diffuse cone behavior and microscopic structure of the de Vries smectic-A and smectic-C phases", Proc. SPIE 8114, Liquid Crystals XV, 81140O (22 September 2011); https://doi.org/10.1117/12.893045
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Chemistry

Molecules

Current controlled current source

Information technology

Liquid crystals

Physics

Scatter measurement

RELATED CONTENT

Imaging of Liquid Crystals Using a Tunneling Microscope
Proceedings of SPIE (July 25 1989)
Time-resolved techniques: an overview
Proceedings of SPIE (January 01 1991)
Synthesis and mesophase studies of crown ether derivatives
Proceedings of SPIE (January 01 1998)
Refinements in XAFS Theory
Proceedings of SPIE (August 12 1986)

Back to Top