Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY

Jens Rehanek; Franz Schäfers; Alexei Erko; Michael Scheer; Wolfgang Freund; Jan Grünert; Cigdem Ozkan; Serguei Molodtsov

doi:10.1117/12.906038

23 September 2011 Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY

Jens Rehanek, Franz Schäfers, Alexei Erko, Michael Scheer, Wolfgang Freund, Jan Grünert, Cigdem Ozkan, Serguei Molodtsov

Author Affiliations +

Proceedings Volume 8141, Advances in Computational Methods for X-Ray Optics II; 814109 (2011) https://doi.org/10.1117/12.906038
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

This paper presents the outcome of ray tracing simulations for different optical schemes to be setup at the European X-ray Free Electron Laser facility (XFEL.EU), Germany: one- or two- channel (cut) crystal X-ray monochromators (K-Mono; using spontaneous radiation) are planned and designed mainly for photon beam based alignment, which is gap tuning of the undulator segments and phase tuning of the phase shifters during commissioning and maintenance of the undulators. The coherent SASE (Self Amplified Spontaneous Emission) radiation will be monitored pulse-resolved by single-shot spectrometers of which two types are investigated: i) a three element spectrometer, design proposed by Yabashi et al., which consists of a curved focusing mirror, followed by a flat analyzer crystal and a 2D-detector.ii) a two element spectrometer based on a reflection zone plate that reflects and focuses in one step, and a 2D-detector (currently under development).

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Jens Rehanek, Franz Schäfers, Alexei Erko, Michael Scheer, Wolfgang Freund, Jan Grünert, Cigdem Ozkan, and Serguei Molodtsov "Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY", Proc. SPIE 8141, Advances in Computational Methods for X-Ray Optics II, 814109 (23 September 2011); https://doi.org/10.1117/12.906038

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