The use of EM-CCDs on high resolution soft x-ray spectrometers

James H. Tutt; Andrew D. Holland; Neil J. Murray; Richard D. Harriss; David J. Hall; Matt Soman; Randall L. McEntaffer; James Endicott

doi:10.1117/12.895981

13 September 2011 The use of EM-CCDs on high resolution soft x-ray spectrometers

James H. Tutt, Andrew D. Holland, Neil J. Murray, Richard D. Harriss, David J. Hall, Matt Soman, Randall L. McEntaffer, James Endicott

Author Affiliations +

Proceedings Volume 8145, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII; 81450L (2011) https://doi.org/10.1117/12.895981
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

Charge-Coupled Devices (CCDs) have been traditionally used on high resolution soft X-ray spectrometers, but with their ability to increase the signal level in the detector before the readout noise of the system is added, Electron-Multiplying CCDs (EM-CCDs) have the potential to offer many advantages in soft X-ray detection. Through this signal multiplication an EM-CCD has advantages over conventioanl CCDs of increased signal, suppressed noise, faster readout speeds for the same equivalent readout noise and an increased inmmunity to Electro-Magnetic Intereference. This paper will look at present and future spacel applications for high resolution soft X-ray spectrometers and assess the advantages and disadvantage of using EM-CCDs in these applications.

Citation Download Citation

James H. Tutt, Andrew D. Holland, Neil J. Murray, Richard D. Harriss, David J. Hall, Matt Soman, Randall L. McEntaffer, and James Endicott "The use of EM-CCDs on high resolution soft x-ray spectrometers", Proc. SPIE 8145, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII, 81450L (13 September 2011); https://doi.org/10.1117/12.895981

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