New approach to noise factor measurement on microchannel plate of optoelectronic detector

Lei Liu; Yunsheng Qian; Yafeng Qiu

doi:10.1117/12.887709

16 September 2011 New approach to noise factor measurement on microchannel plate of optoelectronic detector

Lei Liu, Yunsheng Qian, Yafeng Qiu

Proceedings Volume 8155, Infrared Sensors, Devices, and Applications; and Single Photon Imaging II; 81550K (2011) https://doi.org/10.1117/12.887709
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

The micro-channel plate (MCP) is an important part to imaging quality of image intensifier. In order to obtained high quality of optoelectronic image devices, the microchannel plate (MCP) should be evaluated before assembled in the devices. A new method for noise power factor determination of MCP is described in this paper. The measurements are in accordance with theory and experiments reported. The system consists of vacuum chamber, electron gun, high voltage supply, imaging luminance meter, control units, signal processing circuit, A/D converter, D/A converter, communication unit, industrial computer and measurement software.

Citation Download Citation

Lei Liu, Yunsheng Qian, and Yafeng Qiu "New approach to noise factor measurement on microchannel plate of optoelectronic detector", Proc. SPIE 8155, Infrared Sensors, Devices, and Applications; and Single Photon Imaging II, 81550K (16 September 2011); https://doi.org/10.1117/12.887709

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