Reflectivity measurement with optical feedback cavity ring-down technique employing a multi-longitudinal-mode diode laser

Zhechao Qu; Yanling Han; Shengming Xiong; Bincheng Li

doi:10.1117/12.905371

28 November 2011 Reflectivity measurement with optical feedback cavity ring-down technique employing a multi-longitudinal-mode diode laser

Zhechao Qu, Yanling Han, Shengming Xiong, Bincheng Li

Author Affiliations +

Proceedings Volume 8190, Laser-Induced Damage in Optical Materials: 2011; 81901C (2011) https://doi.org/10.1117/12.905371
Event: SPIE Laser Damage, 2011, Boulder, Colorado, United States

Abstract

Cavity ring-down (CRD) techniques based on measuring the rate of decay of light intensity inside the optical cavity, are widely used for trace gas analysis and high reflectivity measurement. In this presentation a filtered optical feedback CRD (FOF-CRD) technique employing a multi-longitudinal-mode continuous-wave diode laser is investigated for measuring high reflectivity of high reflective mirrors. The original spectrum of the diode laser without the effect of FOF has two longitudinal modes covering tens of the free spectral ranges (FSR) of the ring down cavity (RDC). Due to the relatively broadband spectrum, the theoretical efficiency of coupling the laser power into the RDC is less than 0.05%. In the FOF-CRD scheme, on the other hand, the FOF induced overall spectrum broadening is experimentally observed, with the diode laser running with several longitudinal modes. However the bandwidth of each longitudinal mode is significantly reduced. The coupling efficiency of the laser power into the RDC is higher than 20% in FOF-CRD technique. The enhancement of the coupling efficiency induced by the FOF effect is nearly three orders of magnitude. High accuracy measurements of high reflectivity are achieved with this simple FOF-CRD scheme.

Citation Download Citation

Zhechao Qu, Yanling Han, Shengming Xiong, and Bincheng Li "Reflectivity measurement with optical feedback cavity ring-down technique employing a multi-longitudinal-mode diode laser", Proc. SPIE 8190, Laser-Induced Damage in Optical Materials: 2011, 81901C (28 November 2011); https://doi.org/10.1117/12.905371

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