Paper
25 January 2012 Removal of misfit dislocations from mismatched layers in heterostructures
Mileta M. Arakelyan
Author Affiliations +
Proceedings Volume 8414, Photonics and Micro- and Nano-structured Materials 2011; 84140K (2012) https://doi.org/10.1117/12.923228
Event: Photonics and Micro- and Nano- structured Materials 2011, 2011, Yerevan, Armenia
Abstract
The method of the misfit dislocation removal from working area of the devices on heterostructures is theoretically offered. The chainlet of the edge dislocation (one-dimensional soliton-soliton bound state) is formed in substrate and film border by special preliminary processing. The stress field of such chainlet pushes away a misfit dislocation incipient on the borders of the heterostructures. By numerical experiment it is shown that the stress field of a chainlet is compressed in a sliding direction and it increases in a perpendicular direction, when the velocity is increased. It is possible to influence locally on the given dislocation varying the parameters of the system.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mileta M. Arakelyan "Removal of misfit dislocations from mismatched layers in heterostructures", Proc. SPIE 8414, Photonics and Micro- and Nano-structured Materials 2011, 84140K (25 January 2012); https://doi.org/10.1117/12.923228
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Heterojunctions

Solitons

Semiconducting wafers

Copper

Crystals

Thin films

Interfaces

Back to Top