Domain of validity of the equation for total integrated scatter (TIS)

James E. Harvey; Narak Choi

doi:10.1117/12.930566

15 October 2012 Domain of validity of the equation for total integrated scatter (TIS)

James E. Harvey, Narak Choi

Proceedings Volume 8495, Reflection, Scattering, and Diffraction from Surfaces III; 849502 (2012) https://doi.org/10.1117/12.930566
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

The analytical expression for total integrated scatter (defined as diffuse reflectance divided by total reflectance) has been around for almost six decades TIS = 1 - exp[-(4π cosθ_i σ/λ)²]. Most surface scatter analysts now realize that the expression is ambiguous unless spatial frequency band-limits are specified for the rms roughness, σ, in the expression. However, there still exists uncertainty about the domain of validity of the expression with regard to both surface characteristics and incident angle. In this paper we will quantitatively illustrate this domain of validity for both Gaussian and fractal one-dimensional surfaces as determined by the rigorous integral equation method (method of moments) of electromagnetic theory. Two dimensional error maps will be used to illustrate the domain of validity as a function of surface characteristics and incident angle. Graphical illustrations comparing the TIS predictions of several approximate surface scatter theories will also be presented.

Citation Download Citation

James E. Harvey and Narak Choi "Domain of validity of the equation for total integrated scatter (TIS)", Proc. SPIE 8495, Reflection, Scattering, and Diffraction from Surfaces III, 849502 (15 October 2012); https://doi.org/10.1117/12.930566

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KEYWORDS

Spatial frequencies

Fractal analysis

Surface roughness

Surface finishing

Light scattering

Scattering

Electromagnetic theory

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