Matrix determination of hidden object reflectance by indirect photography

Simon S. Ferrel; Michael A. Marciniak

doi:10.1117/12.929095

15 October 2012 Matrix determination of hidden object reflectance by indirect photography

Simon S. Ferrel, Michael A. Marciniak

Proceedings Volume 8495, Reflection, Scattering, and Diffraction from Surfaces III; 84950Q (2012) https://doi.org/10.1117/12.929095
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

Indirect photography was recently demonstrated as a technique for imaging hidden objects. A camera and laser are collocated, neither with line-of-sight to the object. Laser light is reflected off a visible surface onto the hidden object, then reflected back to the visible surface and collected by the camera. Varying laser spot position yields different camera images, which are used to construct an "indirect" image of the object. Here, camera images are processed by modeling the system as a set of radiometric transport and reflectance matrices. Matrix formulation and inversion, and those parameters demonstrated to improve indirect image quality, are discussed.

Citation Download Citation

Simon S. Ferrel and Michael A. Marciniak "Matrix determination of hidden object reflectance by indirect photography", Proc. SPIE 8495, Reflection, Scattering, and Diffraction from Surfaces III, 84950Q (15 October 2012); https://doi.org/10.1117/12.929095

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