A fast and accurate surface plasmon resonance system

Y. M. Espinosa Sánchez; D. Luna Moreno; E. Noé Arias; G. Garnica Campos

doi:10.1117/12.930315

15 October 2012 A fast and accurate surface plasmon resonance system

Y. M. Espinosa Sánchez, D. Luna Moreno, E. Noé Arias, G. Garnica Campos

Proceedings Volume 8495, Reflection, Scattering, and Diffraction from Surfaces III; 849518 (2012) https://doi.org/10.1117/12.930315
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

In this work we propose a Surface Plasmon Resonance (SPR) system driven by Labview software which produces a fast, simple and accuracy measurements of samples. The system takes 2000 data in a range of 20 degrees in 20 seconds and 0.01 degrees of resolution. All the information is sent from the computer to the microcontroller as an array of bytes in hexadecimal format to be analyzed. Besides to using the system in SPR measurement is possible to make measurement of the critic angle, and Brewster angle using the Abeles method.

Citation Download Citation

Y. M. Espinosa Sánchez, D. Luna Moreno, E. Noé Arias, and G. Garnica Campos "A fast and accurate surface plasmon resonance system", Proc. SPIE 8495, Reflection, Scattering, and Diffraction from Surfaces III, 849518 (15 October 2012); https://doi.org/10.1117/12.930315

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