Growth of CdZnTe by the detached Bridgman method

Shariar Motakef; Piotr Becla; Stacy Swider; Krzysztof Becla; John Fiala; Matthew R. Overholt

doi:10.1117/12.946212

24 October 2012 Growth of CdZnTe by the detached Bridgman method

Shariar Motakef, Piotr Becla, Stacy Swider, Krzysztof Becla, John Fiala, Matthew R. Overholt

Proceedings Volume 8507, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV; 85070V (2012) https://doi.org/10.1117/12.946212
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

We have developed the detached Bridgman process for growth of CdZnTe crystals. Detachment of the solidification interface from the growth ampoule results in a low density of dislocations in the grown material and large single crystal grains. The detached Bridgman process also provides for direct control of the melt composition close to the growth front, allowing for accurate control of both the density of the Te/Cd precipitates as well as the majority carrier concentration in the grown material. The influence of melt-composition control and compensation by shallow and deep donors on detector performance is presented.

Citation Download Citation

Shariar Motakef, Piotr Becla, Stacy Swider, Krzysztof Becla, John Fiala, and Matthew R. Overholt "Growth of CdZnTe by the detached Bridgman method", Proc. SPIE 8507, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV, 85070V (24 October 2012); https://doi.org/10.1117/12.946212

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