Pattern and form recognition of statistically distributed defects on functional optical surfaces

P. Kadkhoda; P. Chubak; M. Lassahn; D. Ristau

doi:10.1117/12.2018999

24 May 2013 Pattern and form recognition of statistically distributed defects on functional optical surfaces

P. Kadkhoda, P. Chubak, M. Lassahn, D. Ristau

Proceedings Volume 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection; 87911C (2013) https://doi.org/10.1117/12.2018999
Event: SPIE Optical Metrology 2013, 2013, Munich, Germany

Abstract

The inspection of the surface quality of optical components is an essential characterization method for high power laser applications. We report about two different mapping methods based on the measurement of Total Scattering (TS) and phase contrast microscopy. The mappings are used for the determination of the defect density distribution of optical flat surfaces. The mathematical procedure relating data points to a defect area and to the form of objects will be illustrated in details. The involved differential operators and the optimized sub routines adapted to a large number of defects will be underlined. For the decision about the form of the objects, a parameter set including the “fill factor”, “edge ratio” and the “polar distance” will be discussed in respect to their versatility range for the basic forms. The calculated distribution will be expressed in terms of affine probability compared to the basic forms. The extracted size and form distribution function of the defects will be presented for selected high reflective and anti-reflective coating samples.

Citation Download Citation

P. Kadkhoda, P. Chubak, M. Lassahn, and D. Ristau "Pattern and form recognition of statistically distributed defects on functional optical surfaces", Proc. SPIE 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, 87911C (24 May 2013); https://doi.org/10.1117/12.2018999

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