Front Matter: Volume 8819

doi:10.1117/12.2033971

25 September 2013 Front Matter: Volume 8819

Proceedings Volume 8819, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII; 881901 (2013) https://doi.org/10.1117/12.2033971
Event: SPIE NanoScience + Engineering, 2013, San Diego, California, United States

Abstract

This PDF file contains the front matter associated with SPIE Proceedings Volume 8819, including the Title Page, Copyright Information, Table of Contents, and the Conference Committee listing.

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"Front Matter: Volume 8819", Proc. SPIE 8819, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII, 881901 (25 September 2013); https://doi.org/10.1117/12.2033971

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