Determination of the microbolometric FPA's responsivity with imaging system's radiometric considerations

Slawomir Gogler; Grzegorz Bieszczad; Michal Krupinski

doi:10.1117/12.2028859

25 October 2013 Determination of the microbolometric FPA's responsivity with imaging system's radiometric considerations

Slawomir Gogler, Grzegorz Bieszczad, Michal Krupinski

Author Affiliations +

Proceedings Volume 8896, Electro-Optical and Infrared Systems: Technology and Applications X; 88960Y (2013) https://doi.org/10.1117/12.2028859
Event: SPIE Security + Defence, 2013, Dresden, Germany

Abstract

Thermal imagers and used therein infrared array sensors are subject to calibration procedure and evaluation of their voltage sensitivity on incident radiation during manufacturing process. The calibration procedure is especially important in so-called radiometric cameras, where accurate radiometric quantities, given in physical units, are of concern. Even though non-radiometric cameras are not expected to stand up to such elevated standards, it is still important, that the image faithfully represents temperature variations across the scene. Detectors used in thermal camera are illuminated by infrared radiation transmitted through an infrared transmitting optical system. Often an optical system, when exposed to uniform Lambertian source forms a non-uniform irradiation distribution in its image plane. In order to be able to carry out an accurate non-uniformity correction it is essential to correctly predict irradiation distribution from a uniform source. In the article a non-uniformity correction method has been presented, that takes into account optical system’s radiometry. Predictions of the irradiation distribution have been confronted with measured irradiance values. Presented radiometric model allows fast and accurate non-uniformity correction to be carried out.

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Slawomir Gogler, Grzegorz Bieszczad, and Michal Krupinski "Determination of the microbolometric FPA's responsivity with imaging system's radiometric considerations", Proc. SPIE 8896, Electro-Optical and Infrared Systems: Technology and Applications X, 88960Y (25 October 2013); https://doi.org/10.1117/12.2028859

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