Paper
7 March 2014 Image thresholding using standard deviation
Author Affiliations +
Proceedings Volume 9024, Image Processing: Machine Vision Applications VII; 90240R (2014) https://doi.org/10.1117/12.2040990
Event: IS&T/SPIE Electronic Imaging, 2014, San Francisco, California, United States
Abstract
Threshold selection using the within-class variance in Otsu’s method is generally moderate, yet inappropriate for expressing class statistical distributions. Otsu uses a variance to represent the dispersion of each class based on the distance square from the mean to any data. However, since the optimal threshold is biased toward the larger variance among two class variances, variances cannot be used to denote the real class statistical distributions. Therefore, to express more accurate class statistical distributions, this paper proposes the within-class standard deviation as a criterion for threshold selection, and the optimal threshold is then determined by minimizing the within-class standard deviation. Experimental results confirm that the proposed method produced a better performance than existing algorithms.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jung-Min Sung, Dae-Chul Kim, Bong-Yeol Choi, and Yeong-Ho Ha "Image thresholding using standard deviation", Proc. SPIE 9024, Image Processing: Machine Vision Applications VII, 90240R (7 March 2014); https://doi.org/10.1117/12.2040990
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Image analysis

Image segmentation

Lithium

Pattern recognition

Digital imaging

Statistical analysis

Error analysis

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