Beyond polarization microscopy: Mueller matrix microscopy with frequency demodulation

Oriol Arteaga; Ertan Kuntman

doi:10.1117/12.2053336

21 May 2014 Beyond polarization microscopy: Mueller matrix microscopy with frequency demodulation

Oriol Arteaga, Ertan Kuntman

Proceedings Volume 9099, Polarization: Measurement, Analysis, and Remote Sensing XI; 90990R (2014) https://doi.org/10.1117/12.2053336
Event: SPIE Sensing Technology + Applications, 2014, Baltimore, MD, United States

Abstract

Mueller matrix microscopy is the natural generalization of polarization microscopy. It provides images of the Mueller matrix of a sample with micrometric resolution. In this work we describe a Mueller matrix microscope that uses the dual rotating compensator technique to simultaneously determine all the elements of its transmission or reflection Mueller matrix. The instrument uses two compensators that rotate at different frequencies and every Mueller matrix element is determined by using a digital frequency demodulation technique that does the frequency-analysis of the time dependent intensity captured at every pixel of the CCD detector. Transmission and reflection measurements are illustrated with experimental examples.

Citation Download Citation

Oriol Arteaga and Ertan Kuntman "Beyond polarization microscopy: Mueller matrix microscopy with frequency demodulation", Proc. SPIE 9099, Polarization: Measurement, Analysis, and Remote Sensing XI, 90990R (21 May 2014); https://doi.org/10.1117/12.2053336

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