Paper
23 July 2014 Scalable background-limited polarization-sensitive detectors for mm-wave applications
Karwan Rostem, Aamir Ali, John W. Appel, Charles L. Bennett, David T. Chuss, Felipe A. Colazo, Erik Crowe, Kevin L. Denis, Tom Essinger-Hileman, Tobias A. Marriage, Samuel H. Moseley, Thomas R. Stevenson, Deborah W. Towner, Kongpop U-Yen, Edward J. Wollack
Author Affiliations +
Abstract
We report on the status and development of polarization-sensitive detectors for millimeter-wave applications. The detectors are fabricated on single-crystal silicon, which functions as a low-loss dielectric substrate for the microwave circuitry as well as the supporting membrane for the Transition-Edge Sensor (TES) bolometers. The orthomode transducer (OMT) is realized as a symmetric structure and on-chip filters are employed to define the detection bandwidth. A hybridized integrated enclosure reduces the high-frequency THz mode set that can couple to the TES bolometers. An implementation of the detector architecture at Q-band achieves 90% efficiency in each polarization. The design is scalable in both frequency coverage, 30-300 GHz, and in number of detectors with uniform characteristics. Hence, the detectors are desirable for ground-based or space-borne instruments that require large arrays of efficient background-limited cryogenic detectors.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karwan Rostem, Aamir Ali, John W. Appel, Charles L. Bennett, David T. Chuss, Felipe A. Colazo, Erik Crowe, Kevin L. Denis, Tom Essinger-Hileman, Tobias A. Marriage, Samuel H. Moseley, Thomas R. Stevenson, Deborah W. Towner, Kongpop U-Yen, and Edward J. Wollack "Scalable background-limited polarization-sensitive detectors for mm-wave applications", Proc. SPIE 9153, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII, 91530B (23 July 2014); https://doi.org/10.1117/12.2057266
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Cited by 12 scholarly publications.
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KEYWORDS
Sensors

Silicon

Microwave radiation

Bolometers

Semiconducting wafers

Dielectrics

Fabrication

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