Paper
8 October 2014 A review of manufacturing metrology for improved reliability of silicon photovoltaic modules
Kristopher O. Davis, Joseph Walters, Eric Schneller, Hubert Seigneur, R. Paul Brooker, Giuseppe Scardera, Marianne P. Rodgers, Nahid Mohajeri, Narendra Shiradkar, Neelkanth G. Dhere, John Wohlgemuth, Andrew C. Rudack, Winston V. Schoenfeld
Author Affiliations +
Abstract
In this work, the use of manufacturing metrology across the supply chain to improve crystalline silicon (c-Si) photovoltaic (PV) module reliability and durability is addressed. Additionally, an overview and summary of a recent extensive literature survey of relevant measurement techniques aimed at reducing or eliminating the probability of field failures is presented. An assessment of potential gaps is also given, wherein the PV community could benefit from new research and demonstration efforts. This review is divided into three primary areas representing different parts of the c-Si PV supply chain: (1) feedstock production, crystallization and wafering; (2) cell manufacturing; and (3) module manufacturing.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kristopher O. Davis, Joseph Walters, Eric Schneller, Hubert Seigneur, R. Paul Brooker, Giuseppe Scardera, Marianne P. Rodgers, Nahid Mohajeri, Narendra Shiradkar, Neelkanth G. Dhere, John Wohlgemuth, Andrew C. Rudack, and Winston V. Schoenfeld "A review of manufacturing metrology for improved reliability of silicon photovoltaic modules", Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 91790Y (8 October 2014); https://doi.org/10.1117/12.2063781
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Cited by 2 scholarly publications.
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KEYWORDS
Manufacturing

Reliability

Metrology

Semiconducting wafers

Silicon

Crystals

Photovoltaics

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