Paper
27 February 2015 Inductively coupled plasmas (ICP) etching of PZT thin films for fabricating optical waveguide with photoresist/aluminum bilayer masking
Zhipeng Qi, Guohua Hu, Qin Zhu, Lixing Zhang, Manqing Li, Yiping Cui
Author Affiliations +
Abstract
Waveguide morphology, as well as etched surface, is one of the most important factors deciding the performance of optical waveguide devices. In this work, we present a combination using photoresist/aluminum bilayer mask for the ICP etching of PZT (Pb(Zr1-xTix)O3) thin films. The etching results of PZT thin films with different etching methods and various etching conditions were investigated. It was found that using ICP in 30/10sccm CHF3/Ar mixture and 3Pa could help reduce the defects and contaminations on the etched surface of PZT thin films. Compared with 250W/60W dual- electrode ICP etching, a more vertical etch profile of PZT waveguide could be obtained through 100W single-electrode ICP etching under the optimal conditions.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhipeng Qi, Guohua Hu, Qin Zhu, Lixing Zhang, Manqing Li, and Yiping Cui "Inductively coupled plasmas (ICP) etching of PZT thin films for fabricating optical waveguide with photoresist/aluminum bilayer masking", Proc. SPIE 9365, Integrated Optics: Devices, Materials, and Technologies XIX, 93650Z (27 February 2015); https://doi.org/10.1117/12.2074608
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KEYWORDS
Etching

Ferroelectric materials

Waveguides

Thin films

Argon

Photomasks

Antennas

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