High Throughput Cryogenic And Room Temperature Testing Of Focal Plane Components

Stanley Voynick

doi:10.1117/12.948368

27 April 1988 High Throughput Cryogenic And Room Temperature Testing Of Focal Plane Components

Stanley Voynick

Proceedings Volume 0973, Cryogenic Optical Systems and Instruments III; (1988) https://doi.org/10.1117/12.948368
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

To increase production efficiency in the manufacture of infrared focal plane components, test techniques were refined to enhance testing throughput and accuracy. The result is an integrated package of high performance hardware and software tools which performs well in high throughput production environments. The test system is also very versatile. It has been used for readout (multiplexer) device characterization, room temperature automated wafer probing, and focal plane array (FPA) testing. Tests have been performed using electrical and radiometric optical stimulus. An integrated, convenient software package was developed and is used to acquire, reduce, analyze, display, and archive test data. The test software supports fully automated operation for the production environment, as well as menu-driven operation for R&D, characterization and setup purposes. Trade-offs between handling techniques in cryogenic production testing were investigated. " atch processing" is preferred over "continuous flow", primarily due to considerations of contamination of the cryogenic environment.

Citation Download Citation

Stanley Voynick "High Throughput Cryogenic And Room Temperature Testing Of Focal Plane Components", Proc. SPIE 0973, Cryogenic Optical Systems and Instruments III, (27 April 1988); https://doi.org/10.1117/12.948368

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