Analytical analysis of adaptive defect detection in amplitude and phase structures using photorefractive four-wave mixing

George Nehmetallah; John Donoghue; Partha Banerjee; Jed Khoury; Michiharu Yamamoto; Nasser Peyghambarian

doi:10.1117/12.2221911

20 April 2016 Analytical analysis of adaptive defect detection in amplitude and phase structures using photorefractive four-wave mixing

George Nehmetallah, John Donoghue, Partha Banerjee, Jed Khoury, Michiharu Yamamoto, Nasser Peyghambarian

Author Affiliations +

Proceedings Volume 9845, Optical Pattern Recognition XXVII; 98450Q (2016) https://doi.org/10.1117/12.2221911
Event: SPIE Defense + Security, 2016, Baltimore, MD, United States

Abstract

In this work, brief theoretical modeling, analysis, and novel numerical verification of a photorefractive polymer based four wave mixing (FWM) setup for defect detection has been developed. The numerical simulation helps to validate our earlier experimental results to perform defect detection in periodic amplitude and phase objects using FWM. Specifically, we develop the theory behind the detection of isolated defects, and random defects in amplitude, and phase periodic patterns. In accordance with the developed theory, the results show that this technique successfully detects the slightest defects through band-pass intensity filtering and requires minimal additional post image processing contrast enhancement. This optical defect detection technique can be applied to the detection of production line defects, e.g., scratch enhancement, defect cluster enhancement, and periodic pattern dislocation enhancement. This technique is very useful in quality control systems, production line defect inspection, and computer vision.

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George Nehmetallah, John Donoghue, Partha Banerjee, Jed Khoury, Michiharu Yamamoto, and Nasser Peyghambarian "Analytical analysis of adaptive defect detection in amplitude and phase structures using photorefractive four-wave mixing", Proc. SPIE 9845, Optical Pattern Recognition XXVII, 98450Q (20 April 2016); https://doi.org/10.1117/12.2221911

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KEYWORDS

Image filtering

Defect detection

Image enhancement

Four wave mixing

Image processing

Beam splitters

Phase conjugation

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