Development of X-ray spectroscopic polarimetry with bent Si crystals and CFRP substrate

Ryo Iizuka; Takanori Izumiya; Yohko Tsuboi

doi:10.1117/12.2231166

18 July 2016 Development of X-ray spectroscopic polarimetry with bent Si crystals and CFRP substrate

Ryo Iizuka, Takanori Izumiya, Yohko Tsuboi

Proceedings Volume 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray; 99055E (2016) https://doi.org/10.1117/12.2231166
Event: SPIE Astronomical Telescopes + Instrumentation, 2016, Edinburgh, United Kingdom

Abstract

The light from celestial objects includes four important quantities; images, time variation, energy spectrum, and polarization. In the field of X-ray astronomy, the capabilities of the former three have remarkably developed. On the other hand, the progress for the polarimetry is considerably delayed because of technical difficulties. In order to make a breakthrough in the field of X-ray polarimetry, we have developed a new type of optics for X-ray polarimetry. The system is collecting Bragg crystal with large area and very high sensitivity for the polarization dedicated to Fe-K lines. We adopt the 400 re ection of Si(100) crystals with high sensitivity for the polarization around Fe-K lines (6 ~ 7 keV), and bent the crystals with the wide X-ray band and high S/N ratio. Furthermore, to install small area of CCD to non-focal plane, it also has the spectroscopic capability with the better resolution than that of general X-ray CCD.

Our previous development was to bent Si crystals to the cylindrical shape of circle and parabola with the DLC deposition. However, for the better optics for the X-ray polarimetry, the shape should be the paraboloid of revolution to collect X-rays with high S/N ratio. We searched for the method to bent the Si crystals to the shape of the paraboloid of revolution. We devised the method to mold the crystal and the CFRP substrate simultaneously pushed to the sophisticated foundation with the paraboloid of revolution. We developed the prototype of about 8 inch in radius of one-quater size. The crystals was also bent in the circumferential direction. Therefore, the image capability examined with optical parallel beam is 0.6 degree. In this thesis, we discussed the new design for X-ray spectroscopic polarimetry, the evaluation of image capability.

Citation Download Citation

Ryo Iizuka, Takanori Izumiya, and Yohko Tsuboi "Development of X-ray spectroscopic polarimetry with bent Si crystals and CFRP substrate", Proc. SPIE 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray, 99055E (18 July 2016); https://doi.org/10.1117/12.2231166

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