Poster
3 January 2023 Nanoscale imaging of optical near-field distribution by detecting induced force of photothermal expansion
Author Affiliations +
Conference Poster
Abstract
This conference presentation was prepared for the Advanced Optical Imaging Technologies V conference at Photonics Asia, 2022.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuxiao Han, Benfeng Bai, and Hong-Bo Sun "Nanoscale imaging of optical near-field distribution by detecting induced force of photothermal expansion", Proc. SPIE PC12316, Advanced Optical Imaging Technologies V, PC123160J (3 January 2023); https://doi.org/10.1117/12.2641721
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KEYWORDS
Near field optics

Optical imaging

Signal to noise ratio

Atomic force microscopy

Electron microscopes

Nanoimaging

Near field

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