Learning-based quantitative phase microscopy via a single-shot defocused intensity image with pixels aliasing

Jie Zhou; Yanbo Jin; Lingpeng Lu; Jiaji Li; Chao Zuo

doi:10.1117/12.2642641

3 January 2023 Learning-based quantitative phase microscopy via a single-shot defocused intensity image with pixels aliasing

Jie Zhou, Yanbo Jin, Lingpeng Lu, Jiaji Li, Chao Zuo

Author Affiliations +

Proceedings Volume PC12316, Advanced Optical Imaging Technologies V; PC123160R (2023) https://doi.org/10.1117/12.2642641
Event: SPIE/COS Photonics Asia, 2022, Online Only

Conference Poster

Abstract

This conference presentation was prepared for the Advanced Optical Imaging Technologies V conference at Photonics Asia, 2022.

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Jie Zhou, Yanbo Jin, Lingpeng Lu, Jiaji Li, and Chao Zuo "Learning-based quantitative phase microscopy via a single-shot defocused intensity image with pixels aliasing", Proc. SPIE PC12316, Advanced Optical Imaging Technologies V, PC123160R (3 January 2023); https://doi.org/10.1117/12.2642641

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