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With the recent development of X-ray sources with high coherence, such as free-electron X-ray lasers (XFELs) and diffraction-limited storage rings, new possibilities have emerged for applying the advanced phase imaging methods to X-rays. In this talk, I will briefly introduce various phase-measuring methods in the X-ray regime with their pros and cons, and some of the recent advances in phase imaging methods with their successful applications to X-rays at Pohang Accelerator Laboratory.
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KyeoReh Lee, Jun Lim, YongKeun Park, "Recent advances in x-ray phase imaging," Proc. SPIE PC12852, Quantitative Phase Imaging X, PC128520C (13 March 2024); https://doi.org/10.1117/12.3000812