Presentation
13 March 2024 3D refractive index microscopy with multiple-scattering samples
Author Affiliations +
Proceedings Volume PC12852, Quantitative Phase Imaging X; PC128520F (2024) https://doi.org/10.1117/12.3000250
Event: SPIE BiOS, 2024, San Francisco, California, United States
Abstract
This talk will describe new microscopy methods for imaging of thick scattering samples in both transmission and reflection mode. We use computational imaging techniques to measure 3D phase (refractive index) in samples that incur multiple scattering (e.g. embryos or whole organisms), by modeling the scattering and solving an inverse problem with machine-learning augmented inverse solvers.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Laura Waller "3D refractive index microscopy with multiple-scattering samples", Proc. SPIE PC12852, Quantitative Phase Imaging X, PC128520F (13 March 2024); https://doi.org/10.1117/12.3000250
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KEYWORDS
Microscopy

Refractive index

Biological samples

Scattering

Inverse problems

Modeling

Multiple scattering

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