Poster
13 March 2024 Polarization-sensitive intensity diffraction tomography
Seungri Song, Jeongsoo Kim, Taegyun Moon, Baekcheon Seong, Woovin Kim, Chang-Hyuk Yoo, Jun-Kyu Choi, Chulmin Joo
Author Affiliations +
Proceedings Volume PC12852, Quantitative Phase Imaging X; PC128521G (2024) https://doi.org/10.1117/12.3002031
Event: SPIE BiOS, 2024, San Francisco, California, United States
Conference Poster
Abstract
Optical anisotropy is an intrinsic property of many materials which originates from the structural arrangement of molecular structures. Various polarization-sensitive imaging (PSI) methods have been developed to visualize and quantify the birefringence of the optically anisotropic materials. Recently, volumetric imaging techniques were introduced to investigate the three-dimensional (3D) anisotropy distribution. However, those 3D PSI methods are mostly based on single-scattering approximation, which are not suitable for optically complicated, multiple-scattering 3D objects. In this presentation, we present a novel non-interferometric 3D polarization-sensitive computational imaging technology—polarization-sensitive intensity diffraction tomography (PS-IDT) —that enables the reconstruction of 3D anisotropy distribution of both weakly and multiple scattering specimens from intensity-only measurements. We demonstrate the 3D birefringence imaging capabilities of PS-IDT by presenting 3D anisotropy maps of various samples, including potato starch granules and tardigrade.
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Seungri Song, Jeongsoo Kim, Taegyun Moon, Baekcheon Seong, Woovin Kim, Chang-Hyuk Yoo, Jun-Kyu Choi, and Chulmin Joo "Polarization-sensitive intensity diffraction tomography", Proc. SPIE PC12852, Quantitative Phase Imaging X, PC128521G (13 March 2024); https://doi.org/10.1117/12.3002031
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
3D image processing

3D metrology

Diffraction

Tomography

Anisotropy

3D modeling

Birefringence

Back to Top