High-speed atom-based THz imaging for materials analysis and non-destructive testing

Lucy A. Downes

doi:10.1117/12.3038032

16 November 2024 High-speed atom-based THz imaging for materials analysis and non-destructive testing

Lucy A. Downes

Proceedings Volume PC13202, Quantum Technologies for Defence and Security; PC1320209 (2024) https://doi.org/10.1117/12.3038032
Event: Security + Defence, 2024, Edinburgh, United Kingdom

Abstract

This conference presentation was prepared for SPIE Sensors + Imaging 2024.

Conference Presentation

Citation Download Citation

Lucy A. Downes "High-speed atom-based THz imaging for materials analysis and non-destructive testing", Proc. SPIE PC13202, Quantum Technologies for Defence and Security, PC1320209 (16 November 2024); https://doi.org/10.1117/12.3038032

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available