Open Access
15 November 2019 Characterization of a 15- μm cutoff HgCdTe detector array for astronomy
Mario S. Cabrera, Craig W. McMurtry, William J. Forrest, Judith L. Pipher, Meghan L. Dorn, Donald L. Lee
Author Affiliations +
Abstract

The University of Rochester infrared detector group is working together with Teledyne Imaging Sensors to develop mercury cadmium telluride (HgCdTe) 15  μm cutoff wavelength detector arrays for future space missions. To reach the 15-μm cutoff goal, we took an intermediate step by developing four ∼13-μm cutoff wavelength arrays to identify any unforeseen effects related to increasing the cutoff wavelength from the extensively characterized 10-μm cutoff wavelength detector arrays developed for the NEOCam mission. The characterization of the ∼13-μm cutoff wavelength HgCdTe arrays at the University of Rochester allowed us to determine the key dark current mechanisms that limit the performance of these HgCdTe detector arrays at different temperatures and biases when the cutoff wavelength is increased. We present initial dark current and well depth measurements of a 15-μm cutoff array that shows dark current values two orders of magnitude smaller at large reverse bias than would be expected from our previous best structures.

CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Mario S. Cabrera, Craig W. McMurtry, William J. Forrest, Judith L. Pipher, Meghan L. Dorn, and Donald L. Lee "Characterization of a 15- μm cutoff HgCdTe detector array for astronomy," Journal of Astronomical Telescopes, Instruments, and Systems 6(1), 011004 (15 November 2019). https://doi.org/10.1117/1.JATIS.6.1.011004
Received: 29 March 2019; Accepted: 24 October 2019; Published: 15 November 2019
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
KEYWORDS
Mercury cadmium telluride

Detector arrays

Sensors

Capacitance

Diffusion

Temperature metrology

Interference (communication)

RELATED CONTENT


Back to Top