Differential scrubbing in a microchannel-plate intensified CCD detector

William T. Thompson

doi:10.1117/1.1308486

1 October 2000 Differential scrubbing in a microchannel-plate intensified CCD detector

William T. Thompson

Optical Engineering, Vol. 39, Issue 10, (October 2000). https://doi.org/10.1117/1.1308486

One of the detector systems used for the Coronal Diagnostic Spectrometer instrument aboard the Solar and Heliospheric Observatory satellite is an intensified CCD camera. The intensifier section consists of a bare microchannel-plate detector proximity focused onto a phosphor, the light from which is then focused by a lens onto the CCD. Since the positions of the spectral lines are fixed on the detector, this leads to decreased efficiency in those areas of the detector where the strongest lines fall. The steps used to track this differential scrubbing of the detector in flight, and to remove these effects from the data, are described. Implications for future space missions are discussed.

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William T. Thompson "Differential scrubbing in a microchannel-plate intensified CCD detector," Optical Engineering 39(10), (1 October 2000). https://doi.org/10.1117/1.1308486

Published: 1 October 2000

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