Optical Engineering
VOL. 21 · NO. 3 | June 1982
CONTENTS
IN THIS ISSUE

Journal Articles
F. Chiang
Optical Engineering, Vol. 21, Issue 3, 213377, (June 1982) https://doi.org/10.1117/12.7972918
Open Access
TOPICS: Experimental mechanics, Light sources, Optical engineering
F. Chiang, J. Adachi, R. Anastasi, J. Beatty
Optical Engineering, Vol. 21, Issue 3, 213379, (June 1982) https://doi.org/10.1117/12.7972919
TOPICS: Speckle, Solids, Mechanics, Composites, Aluminum, Nondestructive evaluation, Chemical species
Y. Hung
Optical Engineering, Vol. 21, Issue 3, 213391, (June 1982) https://doi.org/10.1117/12.7972920
TOPICS: Shearography, Nondestructive evaluation, Cameras, Photography, Image processing, Interferometry, Fringe analysis
T. Dudderar, P. Simpkins
Optical Engineering, Vol. 21, Issue 3, 213396, (June 1982) https://doi.org/10.1117/12.7972921
TOPICS: Light scattering, Speckle metrology, Laser sintering, Speckle, Metrology, Solids, Liquids
Catherine Wykes
Optical Engineering, Vol. 21, Issue 3, 213400, (June 1982) https://doi.org/10.1117/12.7972922
TOPICS: Speckle pattern, Interferometry, Time metrology, Interferometers
P. Boone
Optical Engineering, Vol. 21, Issue 3, 213407, (June 1982) https://doi.org/10.1117/12.7972923
TOPICS: Speckle, Photography, Civil engineering, Astronomy, Image processing
Pramod Rastogi, Pierre Jacquot
Optical Engineering, Vol. 21, Issue 3, 213411, (June 1982) https://doi.org/10.1117/12.7972924
TOPICS: Speckle metrology, Speckle, 3D metrology, 3D modeling, Holographic interferometry, Motion models, Photography, Speckle interferometry, Interferometry
W. Peters, W. Ranson
Optical Engineering, Vol. 21, Issue 3, 213427, (June 1982) https://doi.org/10.1117/12.7972925
TOPICS: Digital imaging, Stress analysis, Laser metrology, Speckle metrology, Laser scanners, 3D scanning, Speckle pattern
Toyohiko Yatagai, Suezou Nakadate, Masanori Idesawa, Hiroyoshi Saito
Optical Engineering, Vol. 21, Issue 3, 213432, (June 1982) https://doi.org/10.1117/12.7972926
TOPICS: Fringe analysis, Digital image processing, Computing systems, Interferometry, Optical inspection, Visualization, Inspection
Ichirou Yamaguchi
Optical Engineering, Vol. 21, Issue 3, 213436, (June 1982) https://doi.org/10.1117/12.7972927
TOPICS: Image sensors, Electro optics, Speckle pattern, Sensors, Metals, Resistance
F. Chiang, C. Kin
Optical Engineering, Vol. 21, Issue 3, 213441, (June 1982) https://doi.org/10.1117/12.7972928
TOPICS: Objectives, Speckle, Coating, Spatial frequencies, Laser scattering, Scattering, Wavelets, Glasses, Photosensitive materials, Opacity
Cesar Sciammarella
Optical Engineering, Vol. 21, Issue 3, 213447, (June 1982) https://doi.org/10.1117/12.7972929
TOPICS: Holography, Moire patterns, Holographic interferometry, Fringe analysis, Data processing
Daniel Post
Optical Engineering, Vol. 21, Issue 3, 213458, (June 1982) https://doi.org/10.1117/12.7972930
TOPICS: Deflectometry, Moire patterns, Optical filters
D. Holloway
Optical Engineering, Vol. 21, Issue 3, 213468, (June 1982) https://doi.org/10.1117/12.7972931
TOPICS: Holographic interferometry, Wave propagation interference, Explosives, Ruby lasers, Wave propagation, Holography
James MacBain, William Stange, Kevin Harding
Optical Engineering, Vol. 21, Issue 3, 213474, (June 1982) https://doi.org/10.1117/12.7972932
TOPICS: Moire patterns, Holographic interferometry, Holograms, Interferometry, Image analysis, Optical testing
A. Ennos, M. Virdee
Optical Engineering, Vol. 21, Issue 3, 213478, (June 1982) https://doi.org/10.1117/12.7972933
TOPICS: Holographic interferometry, Speckle, Photography, Laser interferometry, Holograms
William Sharpe Jr.
Optical Engineering, Vol. 21, Issue 3, 213483, (June 1982) https://doi.org/10.1117/12.7972934
TOPICS: Interferometry, Fringe analysis, Motion measurement, Temperature metrology, Environmental sensing
R. Sanford
Optical Engineering, Vol. 21, Issue 3, 213489, (June 1982) https://doi.org/10.1117/12.7972935
TOPICS: Holography, Photoelasticity, Visualization, Polarization, Fringe analysis, Systems modeling
R. Anderson, K. MacFeely
Optical Engineering, Vol. 21, Issue 3, 213496, (June 1982) https://doi.org/10.1117/12.7972936
TOPICS: Radar, Reflectivity, Astatine, Liquids, Absorption, Rayleigh scattering, Radiative transfer
Sanford Hinkal
Optical Engineering, Vol. 21, Issue 3, 213506, (June 1982) https://doi.org/10.1117/12.7972937
TOPICS: Magnetism, Magnetometers, Optical alignment, Satellites, Calibration, Magnetic sensors, Sensors, Optical components, Optical testing
Francesco Crescenzi, Antonello Cutolo, Paolo Gay, Salvatore Solimeno
Optical Engineering, Vol. 21, Issue 3, 213511, (June 1982) https://doi.org/10.1117/12.7972938
TOPICS: High power lasers
Irvin Deutsch, Herbert Malamud
Optical Engineering, Vol. 21, Issue 3, 213517, (June 1982) https://doi.org/10.1117/12.7972939
TOPICS: Cornea, Astatine, Light sources and illumination
F. Huck, R. Davis, S. Park, R. Aherron, R. Arduini
Optical Engineering, Vol. 21, Issue 3, 213519, (June 1982) https://doi.org/10.1117/12.7972940
TOPICS: Sensors, Computing systems, Computational modeling, Systems modeling, Atmospheric modeling, Stochastic processes, Remote sensing, Environmental monitoring, Environmental sensing, Earth's atmosphere
J. Cox
Optical Engineering, Vol. 21, Issue 3, 213528, (June 1982) https://doi.org/10.1117/12.7972941
TOPICS: Signal to noise ratio, Sensors, Pulse shaping, Interference (communication), Charge-coupled devices, CCD image sensors, Photodetectors, Signal detection
D. Heflinger, J. Kirk, R. Cordero, G. Evans
Optical Engineering, Vol. 21, Issue 3, 213537, (June 1982) https://doi.org/10.1117/12.7972942
TOPICS: Gallium arsenide, Holography, Photoresist materials, Photoresist developing, Laser development, Laboratory techniques, Fabrication, Argon ion lasers, Ion beams, Etching
J. Doty, B. Hildebrand
Optical Engineering, Vol. 21, Issue 3, 213542, (June 1982) https://doi.org/10.1117/12.7972943
TOPICS: Interferometry, Holographic interferometry, Holograms, Nondestructive evaluation, Holography, Fringe analysis
James Hoell Jr., Charles Harward, Clayton Bair, Burnie Williams
Optical Engineering, Vol. 21, Issue 3, 213548, (June 1982) https://doi.org/10.1117/12.7972944
TOPICS: Ozone, Absorption, Tunable diode lasers, Geophysics
E. Knozinger, R. Wittenbeck, D. Leutloff
Optical Engineering, Vol. 21, Issue 3, 213553, (June 1982) https://doi.org/10.1117/12.7972945
TOPICS: Molecular spectroscopy, Molecules, Solids, Matrices, Far infrared, Fourier spectroscopy, Spectroscopy, Absorption, Phonons, Argon
James Leger, Jack Cederquist, Sing Lee
Optical Engineering, Vol. 21, Issue 3, 213557, (June 1982) https://doi.org/10.1117/12.7972946
TOPICS: Image processing, Astatine, Confocal microscopy, Laser scanners, Holography, Spatial filters, Image analysis, Video processing, Video, Electronics
Robert Tsai
Optical Engineering, Vol. 21, Issue 3, 213565, (June 1982) https://doi.org/10.1117/12.7972947
TOPICS: LCDs, Light valves, Liquid crystals, Optical design, Laser crystals, Laser development, Visualization, Data acquisition, Displays, Laser systems engineering
H Caulfield
Optical Engineering, Vol. 21, Issue 3, 213567, (June 1982) https://doi.org/10.1117/12.7972917
Open Access
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