Robert Martin, William Herzog
Optical Engineering, Vol. 27, Issue 3, 273246, (March 1988) https://doi.org/10.1117/12.7977922
TOPICS: Staring arrays, CMOS technology, Amplifiers, Sensors, Electro optics, Electro optical sensors, Electro optical systems, Photovoltaic detectors, Diodes
In electro-optical detector systems, the noise characteristics of transresistance amplifiers are sensitive to the incremental conductivity of the photovoltaic detector. In this paper we show that the 1/f noise corner frequency contributed to the noise by the amplifier is a function of the bias applied to the detector. The 1/f noise corner frequency of the diode in cooled focal plane arrays is also a function of the reverse bias, but there is an optimum reverse bias that is not 0 V. This fact becomes important when it is necessary to use complementary metal oxide semiconductor amplifiers that have lame 1/f noise corner frequencies.