1 August 1994 Reflection at the Motohiro-Taga interface of two anisotropic materials with columnar microstructures
Akhlesh Lakhtakia, Russell F. Messier
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Abstract
While a thin film with columnar microstructures is growing, a Motohiro-Taga interface is formed when the angle of inclination of the microstructures is abruptly altered in the vertical plane. Reflection of a normally incident plane wave by a Motohiro-Taga interface has been studied. If the plane wave is TE-polarized with respect to the plane contaming the directions of inclination of the columnar microstructures, it is not reflected by the interface; but a TM-polarized plane wave is partially reflected. Because of its polarization-discrimination property, the Motohiro-Taga interface will find application as the basis for devices in the upper millimeter wave and the lower infrared frequency ranges.
Akhlesh Lakhtakia and Russell F. Messier "Reflection at the Motohiro-Taga interface of two anisotropic materials with columnar microstructures," Optical Engineering 33(8), (1 August 1994). https://doi.org/10.1117/12.177108
Published: 1 August 1994
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Cited by 20 scholarly publications.
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KEYWORDS
Interfaces

Thin films

Reflection

Reflectivity

Beryllium

Dielectrics

Silicon films

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