Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms

Min-Cheol Park; Seung-Woo Kim

doi:10.1117/1.602445

1 April 2000 Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms

Min-Cheol Park, Seung-Woo Kim

Optical Engineering, Vol. 39, Issue 4, (April 2000). https://doi.org/10.1117/1.602445

We present a new computational method of white light scanning interferometry for 3-D surface mapping. This method accomplishes the task of detecting the true peak of the interference fringe in two steps. The first step is global search locating the envelope peak by fitting sampled intensity data directly to a symmetric quadratic polynomial. The second step is fine-tuning to precisely determine the fringe peak by compensating for the phase shift on reflection using the absolute fringe order identified by the envelope peak obtained in the first step. This two-step method offers an efficient means of computation to provide a good measuring accuracy with high noise immunity owing to its inherent reliance on least squares principles.

Citation Download Citation

Min-Cheol Park and Seung-Woo Kim "Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms," Optical Engineering 39(4), (1 April 2000). https://doi.org/10.1117/1.602445

Published: 1 April 2000

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available