Bias errors in subpixel displacement estimation for optical correlation-based measurement techniques

Frederik Blumrich

doi:10.1117/1.3456595

1 June 2010 Bias errors in subpixel displacement estimation for optical correlation-based measurement techniques

Frederik Blumrich

Author Affiliations +

Optical Engineering, Vol. 49, Issue 6, 067004 (June 2010). https://doi.org/10.1117/1.3456595

Abstract

The systematic error introduced when using 1-D peak detection algorithms to decompose elliptically shaped correlation peaks is investigated. First, an analytical description of this error is derived, and it is shown that this error can lead to a systematic influence of more than one pixel. Additionally, a general linear 2-D Gaussian algorithm based on least squares estimation is presented to allow correlation peak detection of elliptically shaped peaks without any significant bias error. Finally, the performance of the presented algorithms for subpixel displacement estimation, as well as algorithms provided by commercial software packages, is tested with artificial image pairs of random dot patterns.

©(2010) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Frederik Blumrich "Bias errors in subpixel displacement estimation for optical correlation-based measurement techniques," Optical Engineering 49(6), 067004 (1 June 2010). https://doi.org/10.1117/1.3456595

Published: 1 June 2010

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