Dr. Alfonso Moreno Profile

Dr. Alfonso Moreno

at Univ Autònoma de Barcelona

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Author

Publications (6)

Proceedings Article | 13 May 2013 Paper

Methods to obtain the waveform profile from slope measurements

Alfonso Moreno, Manuel Espínola, José Martínez, Juan Campos

Proceedings Volume 8788, 87881F (2013) https://doi.org/10.1117/12.2020534

KEYWORDS: Error analysis, Finite difference methods, Fourier transforms, Sensors, Deflectometry, Photonic integrated circuits, Spatial frequencies, Interference (communication), Radon, Metrology

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SPIE Journal Paper | 1 March 2005

Frequency response of five integration methods to obtain the profile from its slope

Alfonso Moreno, Juan Campos, Leonid Yaroskavsky

OE, Vol. 44, Issue 03, 033604, (March 2005) https://doi.org/10.1117/12.10.1117/1.1872896

KEYWORDS: Fourier transforms, Optical engineering, Numerical integration, Digital filtering, Convolution, Data integration, Statistical analysis, Point spread functions, Deflectometry, Linear filtering

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Proceedings Article | 14 October 2004 Paper

A fast optical scanning deflectometer for measuring the topography of large silicon wafers

Stefan Krey, Willem van Amstel, Konrad Szwedowicz, Juan Campos, Alfonso Moreno, Erik Lous

Proceedings Volume 5523, (2004) https://doi.org/10.1117/12.559702

KEYWORDS: Semiconducting wafers, Mirrors, Sensors, Polishing, Optical scanning, 3D metrology, Data acquisition, Spatial resolution, Silicon, Deflectometry

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Proceedings Article | 10 September 2004 Paper

Correction of aberrations in an optical correlator by using it as a point diffraction interferometer

Claudio Iemmi, Alfonso Moreno, Josep Nicolas, Juan Campos

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.545753

KEYWORDS: Optical correlators, LCDs, Phase shifts, Wavefronts, Point diffraction interferometers, Optical filters, Phase measurement, Fourier transforms, Liquid crystals, Interferometry

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Proceedings Article | 19 November 2003 Paper

Comparison of three methods of integration to obtain the profile from its slope

Leonid Yaroslavsky, Juan Campos, A. Moreno, Maria Yzuel

Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.530333

KEYWORDS: Point spread functions, Data integration, Numerical integration, Detection theory, Integrated optics, Convolution, Digital filtering, Fourier transforms, Optical filters, Zoom lenses

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Showing 5 of 6 publications

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