Ms. Amparo Vivo Profile

Amparo Vivo

Engineer at ESRF - The European Synchrotron

SPIE Involvement:

Author

Publications (22)

Proceedings Article | 3 October 2023 Presentation + Paper

Surface figure correction using differential deposition of WSi2

Ch. Morawe, P. Bras, S. Labouré, F. Perrin, A. Vivo

Proceedings Volume 12694, 1269405 (2023) https://doi.org/10.1117/12.2676633

KEYWORDS: Film thickness, Mirrors, Mirror surfaces, Coating stress, Silicon, Metrology, X-rays, Sputter deposition, X-ray optics, Thin film deposition

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Proceedings Article | 7 June 2023 Presentation + Paper

Differential deposition applied to x-ray mirror substrates

Patrice Bras, Sylvain Labouré, Amparo Vivo, François Perrin, Christian Morawe

Proceedings Volume 12576, 1257607 (2023) https://doi.org/10.1117/12.2665823

KEYWORDS: Reflection, X-rays, Mirrors, Mirror surfaces, X-ray optics, Particles, Optical surfaces, Metrology, X-ray characterization

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Proceedings Article | 21 September 2021 Presentation + Paper

Mirror figure correction on variable length scales

Ch. Morawe, P. Bras, S. Labouré, F. Perrin, A. Vivo

Proceedings Volume 11837, 118370C (2021) https://doi.org/10.1117/12.2595034

KEYWORDS: Platinum, Mirrors, X-rays, X-ray optics, Chromium, Metrology, Thin film coatings, Surface roughness, Silicon, Reflectivity

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Proceedings Article | 9 September 2019 Presentation + Paper

Differential deposition for figure correction of x-ray mirrors

Ch. Morawe, S. Labouré, J-Ch. Peffen, F. Perrin, A. Vivo, R. Barrett

Proceedings Volume 11108, 1110807 (2019) https://doi.org/10.1117/12.2528750

KEYWORDS: Chromium, Mirrors, X-rays, Surface roughness, Reflectivity, X-ray optics, Metrology, Thin film coatings, Interferometers, Scanning electron microscopy

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Proceedings Article | 7 September 2017 Paper

Fizeau stitching at the European Synchrotron Radiation Facility (ESRF)

Amparo Vivo, Raymond Barrett

Proceedings Volume 10385, 103850N (2017) https://doi.org/10.1117/12.2274745

KEYWORDS: Mirrors, 3D modeling, X-rays, Synchrotrons, X-ray optics, Nano opto mechanical systems, 3D metrology, Environmental sensing, Metrology, Interferometry

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Proceedings Article | 26 August 2015 Paper

Graded multilayers for figured Kirkpatrick-Baez mirrors on the new ESRF end station ID16A

Ch. Morawe, R. Barrett, P. Cloetens, B. Lantelme, J.-Ch. Peffen, A. Vivo

Proceedings Volume 9588, 958803 (2015) https://doi.org/10.1117/12.2189279

KEYWORDS: Mirrors, Multilayers, X-rays, Reflectivity, Diffraction, Sputter deposition, Optical coatings, X-ray optics, Nanoimaging, Optical simulations

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Proceedings Article | 28 September 2011 Paper

Dynamically-figured mirror system for high-energy nanofocusing at the ESRF

R. Barrett, R. Baker, P. Cloetens, Y. Dabin, C. Morawe, H. Suhonen, R. Tucoulou, A. Vivo, L. Zhang

Proceedings Volume 8139, 813904 (2011) https://doi.org/10.1117/12.894735

KEYWORDS: Mirrors, Finite element methods, X-rays, Polishing, Optics manufacturing, X-ray optics, Manufacturing, Multilayers, Silicon, Gold

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Proceedings Article | 28 September 2011 Paper

Spatial coherence studies on x-ray multilayers

Ch. Morawe, R. Barrett, K. Friedrich, R. Klünder, A. Vivo

Proceedings Volume 8139, 813909 (2011) https://doi.org/10.1117/12.894617

KEYWORDS: Silicon, Reflection, X-rays, Multilayers, Visibility, Surface roughness, Interfaces, Spatial coherence, Coherence (optics), Reflectivity

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Proceedings Article | 27 August 2010 Paper

ESRF metrology laboratory: overview of instrumentation, measurement techniques, and data analysis

Amparo Vivo Rommeveaux, Benjamin Lantelme, Raymond Barrett

Proceedings Volume 7801, 780107 (2010) https://doi.org/10.1117/12.864141

KEYWORDS: Mirrors, Fizeau interferometers, X-rays, Interferometry, Optics manufacturing, Spherical lenses, Metrology, Objectives, Optical spheres, X-ray optics

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Proceedings Article | 27 September 2007 Paper

Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors

A. Rommeveaux, L. Assoufid, H. Ohashi, H. Mimura, K. Yamauchi, J. Qian, T. Ishikawa, C. Morawe, A. Macrander, A. Khounsary, S. Goto

Proceedings Volume 6704, 67040B (2007) https://doi.org/10.1117/12.736171

KEYWORDS: Mirrors, Spherical lenses, Metrology, X-rays, Error analysis, Silicon, Silicon carbide, Interferometry, Optical components, Sensors

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Proceedings Article | 20 September 2007 Paper

Diamonds for x-ray optical applications at 3rd and 4th generation x-ray sources

R. Burns, A. Chumakov, G. Carbone, S. Connell, D. Dube, H. Godfried, J. Hansen, J. Härtwig, F. Masiello, M. Rebak, A. Rommeveaux, R. Setshedi, P. Van Vaerenbergh, A. Gibaud

Proceedings Volume 6705, 67050K (2007) https://doi.org/10.1117/12.736698

KEYWORDS: X-rays, Diamond, Crystals, X-ray optics, Grazing incidence, Reflectivity, Optical components, X-ray diffraction, Coherence (optics), X-ray sources

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Proceedings Article | 11 September 2006 Paper

Reflectivity and stress responses of multilayers upon isothermal treatment

C. Borel, C. Morawe, A. Rommeveaux, C. Huguenot, J.-C. Peffen

Proceedings Volume 6317, 63170I (2006) https://doi.org/10.1117/12.678472

KEYWORDS: Multilayers, Annealing, Ruthenium, Reflectivity, Interfaces, Coating, Solids, Data modeling, X-rays, Metals

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Proceedings Article | 29 August 2006 Paper

Graded multilayers for focusing hard x-rays below 50 nm

Ch. Morawe, O. Hignette, P. Cloetens, W. Ludwig, Ch. Borel, P. Bernard, A. Rommeveaux

Proceedings Volume 6317, 63170F (2006) https://doi.org/10.1117/12.679039

KEYWORDS: Mirrors, Diffraction, Multilayers, Reflection, Reflectivity, X-rays, Refraction, Coating, Synchrotrons, X-ray optics

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Proceedings Article | 17 September 2005 Paper

Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories

Lahsen Assoufid, Amparo Rommeveaux, Haruhiko Ohashi, Kazuto Yamauchi, Hidekazu Mimura, Jun Qian, Olivier Hignette, Tetsuya Ishikawa, Christian Morawe, Albert Macrander, Ali Khounsary, Shunji Goto

Proceedings Volume 5921, 59210J (2005) https://doi.org/10.1117/12.623209

KEYWORDS: Mirrors, Silicon, Metrology, Data conversion, Error analysis, Sensors, X-rays, Fourier transforms, Optical metrology, Synchrotron radiation

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Proceedings Article | 17 September 2005 Paper

Mirror metrology and bender characterization at ESRF

Amparo Rommeveaux, Olivier Hignette, Christian Morawe

Proceedings Volume 5921, 59210N (2005) https://doi.org/10.1117/12.621379

KEYWORDS: Mirrors, Metrology, Head, Interferometers, Platinum, X-rays, Calibration, Interferometry, Optical components, Optical testing

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Proceedings Article | 17 September 2005 Paper

First report on a European round robin for slope measuring profilers

Amparo Rommeveaux, Muriel Thomasset, Daniele Cocco, Frank Siewert

Proceedings Volume 5921, 59210I (2005) https://doi.org/10.1117/12.621087

KEYWORDS: Mirrors, Metrology, Error analysis, Sensors, Spherical lenses, Head, Nano opto mechanical systems, X-ray optics, Calibration, Interferometers

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Proceedings Article | 24 December 2002 Paper

Design and performance of the flexural-hinge-based mirror bender at the SLS protein crystallography beamline X06SA

Daniel Rossetti, Ulrich Lienert, Claude Pradervand, Roman Schneider, Ming Shi, Sasa Zelenika, Michel Rossat, Olivier Hignette, Amparo Rommeveaux, Clemens Schulze-Briese

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.453695

KEYWORDS: Mirrors, Actuators, Proteins, Laser sintering, Crystallography, Kinematics, Crystals, Silica, Metrology, Surface roughness

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Proceedings Article | 24 December 2002 Paper

Toroidal mirror for single-pulse experiments on ID09B

Laurent Eybert, Michael Wulff, Wolfgang Reichenbach, A. Plech, F. Schotte, E. Gagliardini, Lin Zhang, Olivier Hignette, Amparo Rommeveaux, Andreas Freund

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.455683

KEYWORDS: Mirrors, Monochromators, X-rays, Diffraction, Photons, Polishing, Platinum, Actuators, Reflectivity, Silicon

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Proceedings Article | 24 December 2002 Paper

The present state of Kirkpatrick-Baez mirror systems at the ESRF

Yves Dabin, Gérard Rostaing, Olivier Hignette, Amparo Rommeveaux, Andreas Freund

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.455686

KEYWORDS: Mirrors, X-rays, Silicon, Multilayers, Reflectivity, Platinum, Californium, Interfaces, Alignment procedures, Actuators

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Proceedings Article | 13 December 2001 Paper

Submicron focusing of hard x rays with reflecting surfaces at the ESRF

Olivier Hignette, Gerard Rostaing, Peter Cloetens, Amparo Rommeveaux, Wolfgang Ludwig, Andreas Freund

Proceedings Volume 4499, (2001) https://doi.org/10.1117/12.450227

KEYWORDS: Mirrors, X-rays, Metrology, Tolerancing, Cameras, Bismuth, Sensors, Polishing, Diffraction, Microscopy

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Proceedings Article | 16 November 1999 Paper

Flat x-ray mirrors as optical elements for coherent synchrotron radiation conditioning

Amparo Rommeveaux, Alexei Souvorov

Proceedings Volume 3773, (1999) https://doi.org/10.1117/12.370113

KEYWORDS: Mirrors, X-rays, X-ray optics, Optical components, Synchrotron radiation, Coherence (optics), Scattering, X-ray imaging, Surface roughness, Phase shift keying

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