Anika A. Kinkhabwala
Device Characterization Engineer/Scientist at Solopower Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 March 2003 Paper
Jan-Willem den Herder, A. Brinkman, Steven Kahn, Graziella Branduardi-Raymont, M. Audard, E. Behar, A. Blustin, Antonius den Boggende, Jean Cottam, Christian Erd, Carlos Gabriel, Manuel Guedel, K. van der Heyden, Jelle Kaastra, A. Kinkhabwala, Maurice Leutenegger, Rolf Mewe, Frits Paerels, A. J. Raassen, J. Peterson, A. Pollock, Andrew Rasmussen, M. Sako, M. Santos-Lleo, K. Steenbrugge, T. Tamura, Cor de Vries
Proceedings Volume 4851, (2003) https://doi.org/10.1117/12.461150
KEYWORDS: Charge-coupled devices, Roentgenium, X-rays, Spectrometers, Absorption, Neon, Sensors, Calibration, X-ray optics, Plasma

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