Dr. Annette Hultaker Profile

Dr. Annette Hultaker

at Fraunhofer IOF

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 25 February 2004 Paper

Characterization of CaF₂ substrates for VUV fluoride coatings

Annette Hultaker, Stefan Gliech, Henning Gessner, Angela Duparre

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.512691

KEYWORDS: Scattering, Vacuum ultraviolet, Atomic force microscopy, Optical coatings, Scatter measurement, Light scattering, Surface finishing, Polishing, Autoregressive models, Silicon

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Proceedings Article | 25 February 2004 Paper

157- and 193-nm scatter, R, and T measurement technique

Stefan Gliech, Henning Gessner, Annette Hultaker, Angela Duparre

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513321

KEYWORDS: Scatter measurement, Reflectivity, Vacuum ultraviolet, Transmittance, Scattering, Optical spheres, Backscatter, Autoregressive models, Light scattering, Deep ultraviolet

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Proceedings Article | 4 November 2003 Paper

VUV light-scattering measurements of substrates and thin film coatings

Annette Hultaker, Stefan Gliech, Nils Benkert, Angela Duparre

Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.505585

KEYWORDS: Scatter measurement, Scattering, Light scattering, Reflectivity, Transmittance, Vacuum ultraviolet, Atomic force microscopy, Thin film coatings, Backscatter, Optical coatings

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Proceedings Article | 30 May 2003 Paper

Characterizing CaF2 for VUV optical components: roughness, surface scatter, and bulk scatter

Annette Hultaker, Nils Benkert, Stefan Gliech, Angela Duparre

Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.472392

KEYWORDS: Vacuum ultraviolet, Optical components, Laser optics, Dysprosium, Scattering, Laser induced damage, Ruthenium, Scatter measurement, Surface roughness, Reflectivity

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Proceedings Article | 19 November 2001 Paper

Electrical and optical properties of thin films prepared by spin coating a dispersion of nano-sized tin-doped indium-oxide particles

Jesper Ederth, Annette Hultaker, Peter Heszler, Gunnar Niklasson, Claes-Goeran Granqvist, Arie van Doorn, Chris van Haag, Michel Jongerius, Detlef Burgard

Proceedings Volume 4590, (2001) https://doi.org/10.1117/12.454615

KEYWORDS: Annealing, Absorption, Particles, Transmittance, Thin films, Optical properties, Coating, Near infrared, Glasses, Thin film coatings

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