Dr. Artur G. Olszak Profile

Dr. Artur G. Olszak

VP Engineering at Äpre Instruments Inc

SPIE Involvement:

Conference Program Committee | Author

Area of Expertise:

Optical Metrology

Websites:

Company Website

Publications (20)

Proceedings Article | 15 November 2019 Presentation + Paper

Spectrally controlled interferometry for improved radius of curvature measurement

Chase Salsbury, Artur Olszak

Proceedings Volume 11175, 1117517 (2019) https://doi.org/10.1117/12.2536964

KEYWORDS: Interferometry, Distance measurement, Light sources, Phase shifting, Phase measurement, Tolerancing, Environmental sensing, Turbulence, Astronomy, Mirrors

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Proceedings Article | 28 June 2019 Paper

Spectrally controlled interferometry for high numerical aperture spherical cavity measurements

Chase Salsbury, Donald Pearson, Artur Olszak

Proceedings Volume 11171, 111710D (2019) https://doi.org/10.1117/12.2527151

KEYWORDS: Phase shifts, Spherical lenses, Phase shifting, Interferometry, Ferroelectric materials, Modulation, Phase shift keying, Fizeau interferometers, Optical testing, Optical components

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High numerical aperture optical elements are relied on for the most demanding applications in optical imaging but pose a significant challenge for conventional metrology techniques. Laser Fizeau interferometers provide a flexible measurement platform for measuring spherical optics by offering a common path configuration to test spherical optics against a convex reference surface. However, in this configuration, traditional piezoelectric transducer (PZT) based phase shifters produce non-uniform phase shifts which vary across the aperture as the spherical reference surface is translated along the optical axis. While these errors are negligible for low numerical aperture optics, the phase shift errors quickly become significant for high numerical aperture optics. The phase shift nonuniformity results in fringe print through and phase ripple artifacts which limit overall accuracy of phase shifted interferometry (PSI) measurements. Spectrally controlled interferometry (SCI) is a method which produces localized, high contrast interference fringes in non-zero optical path length cavities through tailored control of the sources spectral distribution. In addition to fringe location, fringe phase is also controlled through spectrum manipulation without mechanical motion or compensation. As a consequence, the SCI method produces uniform, full-aperture phase shifts with a high degree of linearity regardless of numerical aperture; thus, phase shift errors associated with traditional PZTs can be eliminated. Furthermore, because SCI is a source driven method, it can easily be integrated with any Fizeau interferometer. In this paper, we present the fundamental background for SCI and the advantages of the method as they apply to the measurement of high numerical aperture spherical optics. Additionally, we compare PSI measurements between a traditional laser Fizeau interferometer with PZT based phase shifters and an SCI Fizeau interferometer. Existing methods to this problem are discussed and compared with the presented SCI method, as well.

Proceedings Article | 18 August 2018 Presentation + Paper

Towards instantaneous spectrally controlled interferometry

Chase Salsbury, Artur Olszak

Proceedings Volume 10749, 107490U (2018) https://doi.org/10.1117/12.2318896

KEYWORDS: Phase shifting, Phase measurement, Modulation, Phase shifts, Interferometry, Fizeau interferometers, Interferometers, Metrology

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Proceedings Article | 7 August 2018 Paper

Spectrally controlled source for interferometric measurements of multiple surface cavities

Chase Salsbury, Jan Posthumus, Artur Olszak

Proceedings Volume 10829, 108290C (2018) https://doi.org/10.1117/12.2318641

KEYWORDS: Interferometers, Optical testing, Interferometry, Refractive index, Wavefronts, Fizeau interferometers, Adaptive optics, Monochromatic aberrations, Modulation

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We present a new light source capable of locating interference fringes at an adjustable distance from the interferometer. The spectrum is electronically controlled in such a way that the fringes are limited to only one of the surfaces of the optics under test. With the new source it is straightforward, for example, to measure the parallel surfaces of thin glass plates and multiple surface cavities. Existing interferometers, as well as older systems, can be upgraded with this source.

Traditional methods of interferometry are widely used and accepted for simple measurement configurations, but measurement accuracy can decrease rapidly with increasing measurement complexity. For example, coherent interferometry struggles to achieve accurate and repeatable results with the presence of any additional feedback surface in the measurement cavity due to temporally coherent back reflections. Conversely, incoherent interferometers can isolate single surfaces for measurement but require more complex interferometer system designs. As a result, many of these systems are limited in their dynamic range of measurable cavity sizes and present considerable difficulties in the alignment process, increasing total measurement time. Both methods are inherently restricted by the intrinsic properties of their respective source.

Spectrally controlled interferometry (SCI) is a source driven method which inherits many advantages from both coherent and incoherent interferometry while evading typical limitations. The sources spectral properties are manipulated to produce a tunable coherence function in measurement space which allows control over the coherence envelope width, the fringe location, and the fringe phase. With this source realization, a host of measurement advantages which simplify measurement complexity and reduce total measurement time becomes available. One major application is the extinction of extraneous surface back reflections. Without any mechanical translation, realignment, or traditional piezoelectric transducers, front and back surfaces of planar optics can be isolated independently and complete phase shifting interferometric (PSI) measurements can be taken. Furthermore, because all control parameters are implemented at the source level, the spectrally controlled source is a good candidate for upgrading existing interferometer systems.

In this paper, we present the theoretical background for this source and the implications of the method. Additionally, a multiple surface cavity measurement is provided as a means of demonstrating the spectrally controlled sources capability to isolate individual cavities from detrimental back reflections across a large dynamic range of measurable cavity sizes without mechanical realignment. A discussion of the implementation benefits and practical details will be included. Limitations and comparisons to alternative methods will be addressed, as well.

Proceedings Article | 16 October 2017 Paper

Spectrally controlled interferometry for measurements of flat and spherical optics

Chase Salsbury, Artur Olszak

Proceedings Volume 10448, 104481C (2017) https://doi.org/10.1117/12.2279811

KEYWORDS: Interferometry, Spherical lenses, Phase shifting, Interferometers, Modulation, Reflection, Optical metrology, Visibility, Laser interferometry, Optical testing

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Proceedings Article | 7 March 2006 Paper

Improved fast white-light scanning profilometer

Artur Olszak

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498419

KEYWORDS: Cameras, Calibration, Interferometry, Modulation, Head, Interferometers, Light sources, Profilometers, Charge-coupled devices, Coherence (optics)

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Proceedings Article | 8 September 2004 Paper

Conventional and fiber optics interferometry for vibration mode analysis

Krzysztof Patorski, Artur Olszak, Leszek Salbut, Agata Jozwicka, Jacek Kacperski, Michal Jozwik, Anna Sliwa

Proceedings Volume 5576, (2004) https://doi.org/10.1117/12.581775

KEYWORDS: Interferometry, Fiber optics, Phase shift keying, Semiconductor lasers, Modulation, Ferroelectric materials, Bessel functions, Speckle pattern, Heterodyning, Interferometers

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Proceedings Article | 22 December 2003 Paper

Characterization of aspherical surface that has high numerical aperture by using a computer-generated hologram

Junwon Lee, Artur Olzak, Chen Liang, Michael Descour

Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.506621

KEYWORDS: Computer generated holography, Diffraction, Interferometers, Micro optics, Optical spheres, Binary data, Wavefronts, Fringe analysis, Spherical lenses, Optical fabrication

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SPIE Journal Paper | 1 January 2003

High-stability white-light interferometry with reference signal for real-time correction of scanning errors

Artur Olszak, Joanna Schmit

OE, Vol. 42, Issue 01, (January 2003) https://doi.org/10.1117/12.10.1117/1.1523942

KEYWORDS: Scanners, Interferometers, Signal detection, Interferometry, Light sources, Calibration, Sensors, Beam splitters, Motion measurement, Cameras

Proceedings Article | 20 June 2002 Paper

White-light interferometry with reference signal

Joanna Schmit, Artur Olszak, Shawn McDermed

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472209

KEYWORDS: Scanners, Interferometers, Interferometry, Sensors, Signal detection, Motion measurement, Signal processing, Beam splitters, Light sources, Optical interferometry

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Proceedings Article | 20 June 2002 Paper

Challenges in white-light phase-shifting interferometry

Joanna Schmit, Artur Olszak

Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472211

KEYWORDS: Scanners, Interferometry, Phase interferometry, Phase measurement, Phase shifting, Interferometers, Fringe analysis, Coherence (optics), Optical interferometry, Microscopes

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Proceedings Article | 2 November 2000 Paper

Present and future interference microscope systems for magnetic head metrology

Paul Caber, Artur Olszak, Chip Ragan, David Aziz

Proceedings Volume 4099, (2000) https://doi.org/10.1117/12.405817

KEYWORDS: Microscopes, Objectives, Head, Magnetism, Metrology, Ultraviolet radiation, Interferometers, Beam splitters, Cameras, Data storage

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Proceedings Article | 21 March 2000 Paper

Design of an interferometer for the measurement of long radius optics

Sen Han, Joseph Lamb, Artur Olszak, Erik Novak

Proceedings Volume 3966, (2000) https://doi.org/10.1117/12.380092

KEYWORDS: Interferometers, Monochromatic aberrations, LIGO, Distortion, Collimators, Metrology, Mirrors, Optical design, Imaging systems, Pellicles

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Proceedings Article | 17 August 1999 Paper

High-performance interferometer for site flatness inspection

Artur Olszak, Erik Novak, Ken Stumpe, James Semrad

Proceedings Volume 3745, (1999) https://doi.org/10.1117/12.357804

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Proceedings Article | 29 March 1999 Paper

High-speed interferometric aluminum disk blank tester

Artur Olszak, Ken Stumpe, Raymond Copenhaver, George Angeli

Proceedings Volume 3619, (1999) https://doi.org/10.1117/12.343703

KEYWORDS: Interferometers, Mirrors, Aluminum, Zernike polynomials, Data acquisition, Metrology, Shape analysis, Sensors, Beam splitters, Phase shifting

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Proceedings Article | 29 March 1999 Paper

Laser Fizeau interferometer for silicon wafer site flatness testing

Erik Novak, Artur Olszak, Ken Stumpe, Robert Knowlden, Leonid Malevanchik, George Angeli

Proceedings Volume 3619, (1999) https://doi.org/10.1117/12.343704

KEYWORDS: Semiconducting wafers, Silicon, Wafer testing, Photovoltaics, Fizeau interferometers, Interferometers, Metrology, Imaging systems, Semiconductor lasers, Laser metrology

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SPIE Journal Paper | 1 August 1997

Analysis of the Fresnel field of a double diffraction system in the case of two amplitude diffraction gratings under partially coherent illumination

Artur Olszak, Leszek Wronkowski

OE, Vol. 36, Issue 08, (August 1997) https://doi.org/10.1117/12.10.1117/1.601433

KEYWORDS: Diffraction gratings, Transducers, Diffraction, Sensors, Light sources, Optoelectronics, Optical engineering, Binary data, Mathematical modeling, Spatial coherence

SPIE Journal Paper | 1 July 1997

Digital in-plane electronic speckle pattern shearing interferometry

Krzysztof Patorski, Artur Olszak

OE, Vol. 36, Issue 07, (July 1997) https://doi.org/10.1117/12.10.1117/1.601386

KEYWORDS: Speckle pattern, Interferometry, Semiconductor lasers, Prisms, Wavefronts, Modulation, Fringe analysis, Interferometers, Phase shifting, Mirrors

Proceedings Article | 17 July 1996 Paper

Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)

Krzysztof Patorski, Artur Olszak

Proceedings Volume 2860, (1996) https://doi.org/10.1117/12.276312

KEYWORDS: Semiconductor lasers, Prisms, Speckle pattern, Beam splitters, Polarization, Interferometry, Fringe analysis, Modulation, Speckle, Fiber optics

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Proceedings Article | 23 June 1995 Paper

ESPI-FEM hybrid system for studies of time-dependent stress characteristics in small components

Artur Olszak, Ryszard Pryputniewicz

Proceedings Volume 2545, (1995) https://doi.org/10.1117/12.212669

KEYWORDS: Finite element methods, Phase shift keying, Speckle, Interferometry, Semiconductor lasers, Computing systems, Modulation, Data modeling, Image processing, Phase shifts

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Showing 5 of 20 publications

Conference Committee Involvement (4)

Interferometry and Structured Light 2024

21 August 2024 | San Diego, California, United States

Interferometry XXI

24 August 2022 | San Diego, California, United States

Interferometry XX

24 August 2020 | Online Only, California, United States

Interferometry XIX

21 August 2018 | San Diego, California, United States

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